Thesis title: High quality delay testing scheme for a self-timed microprocessor
Presented by: Omar Al-Terkawi
Program: Electrical Engineering
Department: Dép. de génie électrique

Jury

President: Yves Audet
Research Director: Yvon Savaria
Research Co-Director: Claude Thibeault
Member: Yves Blaquière
External member: Benoit Nadeau-Dostie
Representative of the Director of Graduate Studies: Giovanni Beltrame

Free entry
Welcome to all!