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Yves Audet (51)

  • Articles de revue (21)
    • 2022
      • Article de revue
        Mirfakhraei, S.S., Audet, Y., Hassan, A. & Sawan, M. (2022). A Fully Integrated Low-Power Hall-Based Isolation Amplifier With IMR Greater Than 120 dB. IEEE Transactions on Circuits and Systems I: Regular Papers, 10 pages. Tiré de https://doi.org/10.1109/TCSI.2021.3138301
      • Article de revue
        Esmaeilzadeh, M., Audet, Y., Ali, M. & Sawan, M. (2022). A Low-Phase-Noise CMOS Ring Voltage-Controlled Oscillator Intended for Time-Based Sensor Interfaces. IEEE Access, 10, 101186-101197. Tiré de https://doi.org/10.1109/ACCESS.2022.3208273
      • Article de revue
        Mirfakhraei, S.S., Audet, Y., Hassan, A. & Sawan, M. (2022). A Small Footprint Digital Isolator based on CMOS Integrated Hall-effect Sensor. IEEE Sensors Journal, 22(1), 412-418. Tiré de https://doi.org/10.1109/JSEN.2021.3128573
      • Article de revue
        Ali, M., Hassan, A., Honarparvar, M., Nabavi, M., Audet, Y., Sawan, M. & Savaria, Y. (2022). A Versatile SoC/SiP Sensor Interface for Industrial Applications: Implementation Challenges. IEEE Access, 10, 16 pages. Tiré de https://doi.org/10.1109/ACCESS.2022.3152379
      • Article de revue
        Hoque, M.U., Kumar, D., Audet, Y. & Savaria, Y. (2022). Design and Analysis of a 35 GHz Rectenna System for Wireless Power Transfer to an Unmanned Air Vehicle. Energies, 15(1), 19 pages. Tiré de https://doi.org/10.3390/en15010320
    • 2021
      • Article de revue
        Audet, Y., Bendali, A. & David, J.P. (2021). A CMOS Photodetector for or Direct Color Imaging. IEEE Transactions on Electron Devices, 68(3), 1107-1114. Tiré de https://doi.org/10.1109/ted.2021.3052717
      • Article de revue
        Mirfakhraei, S.S., Audet, Y., Hassan, A. & Sawan, M. (2021). A Galvanic Isolated Amplifier Based on CMOS Integrated Hall-Effect Sensors. IEEE Transactions on Circuits and Systems I-Regular Papers, 68(4), 1388-1397. Tiré de https://doi.org/10.1109/tcsi.2021.3052476
    • 2019
      • Article de revue
        Darvishi, M., Audet, Y., Blaquiere, Y., Thibeault, C. & Pichette, S. (2019). On the susceptibility of SRAM-Based FPGA routing network to delay changes induced by ionizing radiation. IEEE Transactions on Nuclear Science, 66(3), 643-654. Tiré de https://doi.org/10.1109/TNS.2019.2898894
    • 2018
      • Article de revue
        Darvishi, M., Audet, Y. & Blaquière, Y. (2018). Delay monitor circuit and delay change measurement due to SEU in SRAM-based FPGA. IEEE Transactions on Nuclear Science, 65(5), 1153-1160. Tiré de https://doi.org/10.1109/TNS.2018.2828785
    • 2017
      • Article de revue
        Zhang, K., Burasa, P. & Audet, Y. (2017). A novel CMOS spectrometer based on wavelength absorption. Sensors and Actuators A: Physical, 268, 9-15. Tiré de https://doi.org/10.1016/j.sna.2017.10.057
    • 2015
      • Article de revue
        Trabelsi, A., Ait, O.M. & Audet, Y. (2015). Robust Parametric Modeling of Speech in Additive White Noise. Journal of Spinal and Information Processing, 6(2), 99-108. Tiré de https://doi.org/10.4236/jsip.2015.62010
    • 2014
      • Article de revue
        Darvishi, M., Audet, Y., Blaquiere, Y., Thibeault, C., Pichette, S. & Tazi, F.Z. (2014). Circuit level modeling of extra combinational delays in SRAM-based FPGAs due to transient ionizing radiation. IEEE Transactions on Nuclear Science, 61(6), 3535-3542. Tiré de https://doi.org/10.1109/TNS.2014.2369424
      • Article de revue
        Tazi, F.Z., Thibeault, C., Savaria, Y., Pichette, S. & Audet, Y. (2014). On extra delays affecting I/O blocks of an SRAM-based FPGA due to ionizing radiation. IEEE Transactions on Nuclear Science, 61(6), 3138-3145. Tiré de https://doi.org/10.1109/TNS.2014.2369417
    • 2013
      • Article de revue
        Thibeault, C., Hariri, Y., Hasan, S.R., Hobeika, C., Savaria, Y., Audet, Y. & Tazi, F.Z. (2013). A library-based early soft error sensitivity analysis technique for SRAM-based FPGA design. Journal of Electronic Testing: Theory and Applications, 29(4), 457-471. Tiré de https://doi.org/10.1007/s10836-013-5393-9
      • Article de revue
        Hobeika, C., Pichette, S., Ghodbane, A., Thibeault, C., Audet, Y., Boland, J.-F. & Saad, M. (2013). Flight control fault models based on SEU emulation. SAE International Journal of Aerospace, 6(2), 643-649. Tiré de https://doi.org/10.4271/2013-01-2246
    • 2012
      • Article de revue
        Thibeault, C., Pichette, S., Audet, Y., Savaria, Y., Rufenacht, H., Gloutnay, E., Blaquiere, Y., Moupfouma, F. & Batani, N. (2012). On Extra Combinational Delays in SRAM FPGAs Due to Transient Ionizing Radiations. IEEE Transactions on Nuclear Science, 59(6), 2959-65. Tiré de https://doi.org/10.1109/TNS.2012.2222668
    • 2011
      • Article de revue
        Singh, R., Audet, Y., Gagnon, Y., Savaria, Y., Boulais, E. & Meunier, M. (2011). A laser-trimmed rail-to-rail precision CMOS operational amplifier. IEEE Transactions on Circuits and Systems II: Express Briefs, 58(2), 75-79. Tiré de https://doi.org/10.1109/TCSII.2010.2104011
    • 2008
      • Article de revue
        Beaudoin, P.M., Audet, Y. & Bendali, A. (2008). Characterizing a Thermoelectric Module as Part of a Semiconductor Course Laboratory. IEEE Transactions on Education, 51(2), 282-287. Tiré de https://doi.org/10.1109/TE.2007.910362
    • 2007
      • Article de revue
        Bendali, A. & Audet, Y. (2007). A 1-V CMOS Current Reference With Temperature and Process Compensation. IEEE Transactions on Circuits and Systems I: Regular Papers, 54(7), 1424-1429. Tiré de https://doi.org/10.1109/TCSI.2007.900176
    • 2006
      • Article de revue
        Sawan, M., Trépanier, A., Trépanier, J.-L., Audet, Y. & Ghannoum, R. (2006). A new CMOS multimode digital pixel sensor dedicated to an implantable visual cortical stimulator. Analog Integrated Circuits and Signal Processing, 49(2), 187-197. Tiré de https://doi.org/10.1007/s10470-006-9184-4
    • 2004
      • Article de revue
        Chapman, G.H., Djaja, S., Cheung, D.Y.H., Audet, Y., Koren, I. & Koren, Z. (2004). A Self-Correcting Active Pixel Sensor Using Hardware and Software Correction. IEEE Design & Test of Computers, 21(6), 544-551. Tiré de https://doi.org/10.1109/MDT.2004.74
  • Communications de conférence (28)
    • 2021
      • Communication de conférence
        Altoobaji, I., Ali, M., Hassan, A., Audet, Y. & Lakhssassi, A. (2021). A High Speed Fully Integrated Capacitive Digital Isolation System in 0.35 m CMOS for Industrial Sensor Interfaces. Communication présentée à 19th IEEE International New Circuits and Systems Conference (NEWCAS 2021), Toulon, France (4 pages). Tiré de https://doi.org/10.1109/NEWCAS50681.2021.9462788
    • 2020
      • Communication de conférence
        Mirfakhraei, S.S., Audet, Y., Hassan, A., Ali, M., Nabavi, M. & Sawan, M. (2020). A CMOS MAGFET-based programmable isolation amplifier. Communication présentée à 18th IEEE International New Circuits and Systems Conference (NEWCAS 2020), Montréal, Qc, Canada (p. 9-13). Tiré de https://doi.org/10.1109/NEWCAS49341.2020.9159790
      • Communication de conférence
        Altoobaji, I., Ali, M., Hassan, A., Nabavi, M., Audet, Y. & Lakhssassi, A. (2020). A Fully Integrated On-Chip Inductive Digital Isolator: Design Investigation and Simulation. Communication présentée à 63rd IEEE International Midwest Symposium on Circuits and Systems (MWSCAS 2020), Springfield, MA, USA (p. 868-871). Tiré de https://doi.org/10.1109/MWSCAS48704.2020.9184560
      • Communication de conférence
        Esmaeilzadeh, M., Ali, M., Hassan, A., Audet, Y. & Sawan, M. (2020). Low-power high-accuracy VCO-based comparator for sensor interface applications. Communication présentée à 18th IEEE International New Circuits and Systems Conference (NEWCAS 2020), Montréal, Qc, Canada (p. 254-588). Tiré de https://doi.org/10.1109/NEWCAS49341.2020.9159801
      • Communication de conférence
        Mirfakhraei, S.S., Audet, Y., Nabavi, M., Youness, B., Ali, M., Hassan, A. & Sawan, M. (2020). Wide Dynamic Range Front-End Programmable Isolation Amplifier using Integrated CMOS Hall Effect Sensor. Communication présentée à IEEE International Symposium on Circuits and Systems (ISCAS 2020), Sevilla, Spain (5 pages). Tiré de https://doi.org/10.1109/ISCAS45731.2020.9180574
    • 2016
      • Communication de conférence
        Dehnavi, M.M., Audet, Y. & Khamsehashari, E. (2016). Differential integrator pixel architecture for dark current compensation in CMOS image sensors. Communication présentée à 14th IEEE International New Circuits and Systems Conference (NEWCAS 2016), Vancouver, Canada (4 pages). Tiré de https://doi.org/10.1109/NEWCAS.2016.7604824
    • 2014
      • Communication de conférence
        Hobeika, C., Pichette, S., Leonard, M.A., Thibeault, C., Boland, J.F. & Audet, Y. (2014). Multi-abstraction level signature generation and comparison based on radiation single event upset. Communication présentée à 20th IEEE International On-Line Testing Symposium (IOLTS 2014), Catalunya, Spain (p. 212-215). Tiré de https://doi.org/10.1109/IOLTS.2014.6873700
    • 2012
      • Communication de conférence
        Benhammadi, S., Audet, Y. & Diaconu, V. (2012). A spectro reflectance camera for in vivo human blood evaluation. Communication présentée à 10th IEEE International New Circuits and Systems Conference (NEWCAS 2012), Montréal, Québec (p. 533-536). Tiré de https://doi.org/10.1109/NEWCAS.2012.6329074
    • 2011
      • Communication de conférence
        Khamsehashari, E. & Audet, Y. (2011). Mode detection of a linear-logarithmic current-mode image sensor. Communication présentée à 9th IEEE International New Circuits and Systems Conference (NEWCAS 2011), Bordeaux, France (p. 538-541). Tiré de https://doi.org/10.1109/NEWCAS.2011.5981203
    • 2010
      • Communication de conférence
        Khamsehashari, E., Audet, Y. & Fayomi, C. (2010). Digital linearity correction of a wide dynamic range current-mode image sensor. Communication présentée à 8th IEEE International NEWCAS Conference (NEWCAS 2010), Montréal, Québec (p. 133-136). Tiré de https://doi.org/10.1109/NEWCAS.2010.5603722
    • 2009
      • Communication de conférence
        Beaudoin, P.M., Audet, Y. & Ponce-Ponce, V.H. (2009). Dark current compensation in CMOS image sensors using a differential pixel architecture. Communication présentée à Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference (NEWCAS-TAISA 2009), Toulouse, France. Tiré de https://doi.org/10.1109/NEWCAS.2009.5290457
    • 2008
      • Communication de conférence
        Audet, Y. & Aboutorabi, S.S. (2008). A CMOS process compatible color sensor using wavelength dependent absorption depth. Communication présentée à Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference (NEWCAS-TAISA 2008), Montréal, QC, Canada (p. 327-330). Tiré de https://doi.org/10.1109/NEWCAS.2008.4606387
    • 2007
      • Communication de conférence
        Hamine, M., Audet, Y. & David, J.P. (2007). A real time image reconstruction algorithm for an integrated fingerprint sensor. Communication présentée à IEEE Northeast Workshop on Circuits and Systems (NEWCAS 2007), Montréal, Québec (p. 807-810). Tiré de https://doi.org/10.1109/NEWCAS.2007.4487984
      • Communication de conférence
        Singh, R., Audet, Y., Gagnon, Y. & Savaria, Y. (2007). Integrated circuit trimming technique for offset reduction in a precision CMOS amplifier. Communication présentée à IEEE International Symposium on Circuits and Systems (ISCAS 2007), New Orleans, LA, USA (p. 709-712). Tiré de https://doi.org/10.1109/ISCAS.2007.377907
    • 2006
      • Communication de conférence
        Audet, Y., Aubray, L. & Blouin, D. (2006). A CMOS Fingerprint Sensor Based on Skin Resistivity. Communication présentée à 4th IEEE International Northeast Workshop on Circuits and Systems (NEWCAS 2006), Gatineau, Québec (p. 269-272). Tiré de https://doi.org/10.1109/NEWCAS.2006.250922
    • 2005
      • Communication de conférence
        Boussaa, M. & Audet, Y. (2005). A 1.6 GHz digital DLL for optical clock-distribution. Communication présentée à 3rd IEEE International Northeast Workshop on Circuits and Systems (NEWCAS 2005), Québec, Québec (p. 146-149). Tiré de https://doi.org/10.1109/NEWCAS.2005.1496693
      • Communication de conférence
        La Haye, M.L., Chapman, G.H., Jung, C., Cheung, D.Y., Djaja, S. & Audet, Y. (2005). Fault-tolerant photodiode and photogate active pixel sensors. Communication présentée à Sensors and camera systems for scientific and industrial applications VI, San Jose, CA (p. 78-89). Tiré de https://doi.org/10.1117/12.588041
    • 2004
      • Communication de conférence
        Trépanier, A., Trépanier, J.L., Sawan, M. & Audet, Y. (2004). A multiple operation mode CMOS digital pixel sensor dedicated to a visual cortical implant. Communication présentée à 47th Midwest Symposium on Circuits and Systems (MWSCAS 2004), Hiroshima, Japan (p. 369-372). Tiré de https://doi.org/10.1109/MWSCAS.2004.1354004
      • Communication de conférence
        Bendali, A. & Audet, Y. (2004). A 1V high-performance CMOS current reference for application in photoreceiver transimpedance amplifier. Communication présentée à Photonics North 2004, Ottawa, Canada (p. 459-466). Tiré de https://doi.org/10.1117/12.567563
      • Communication de conférence
        La Haye, M.L., Chapman, G.H., Jung, C., Cheung, D.Y., Djaja, S. & Audet, Y. (2004). Characteristics of fault-tolerant photodiode and photogate active pixel sensors (APS). Communication présentée à IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2004), Cannes, France (p. 58-66). Tiré de https://doi.org/10.1109/DFTVS.2004.1347825
      • Communication de conférence
        Cheung, D.Y.H., Chapman, G.H., Djaja, S., Audet, Y., Wai, B. & Jung, C. (2004). Fault tolerant Active Pixel Sensors for large area digital imaging systems. Communication présentée à Optoelectronic integrated circuits VI, San Jose CA (p. 142-153). Tiré de https://doi.org/10.1117/12.529923
      • Communication de conférence
        Bendali, A. & Audet, Y. (2004). Low voltage current reference with temperature and process parameter variation compensation. Communication présentée à IASTED International on Circuits, Signals and Systems, Clearwater, Florida, USA (p. 443-446). Tiré de https://www.actapress.com/Abstract.aspx?paperId=18455
      • Communication de conférence
        Trépanier, A., Trépanier, J.L., Sawan, M. & Audet, Y. (2004). New CMOS digital pixel sensor architecture dedicated to a visual cortical implant. Communication présentée à Photonics North 2004, Ottawa (p. 365-376). Tiré de https://doi.org/10.1117/12.567370
    • 2003
      • Communication de conférence
        Trabelsi, A., Savaria, Y. & Audet, Y. (2003). Automatic offset correction technique based on active load tuning. Communication présentée à 1st Annual Northeast Workshop on Circuits and Systems (NEWCAS 2003), Montréal, Québec (p. 5-8).
      • Communication de conférence
        Djaja, S., Chapman, G.H., Cheung, D.Y.H. & Audet, Y. (2003). Implementation and testing of fault-tolerant photodiode-based active pixel sensor (APS). Communication présentée à 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2003), Boston, MA, United states (p. 53-60). Tiré de https://doi.org/10.1109/DFTVS.2003.1250095
    • 2002
      • Communication de conférence
        Trépanier, J.-L., Sawan, M., Audet, Y. & Coulombe, J. (2002). A wide dynamic range CMOS digital pixel sensor. Communication présentée à 45th Midwest Symposium on Circuits and Systems (MWSCAS 2002), Tulsa, OK (p. 437-440). Tiré de https://doi.org/10.1109/MWSCAS.2002.1186892
    • 2001
      • Communication de conférence
        Audet, Y. & Chapman, G.H. (2001). Design of a self-correcting active pixel sensor. Communication présentée à IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, San Francisco, CA, USA (p. 18-26). Tiré de https://doi.org/10.1109/DFTVS.2001.966748
  • Brevets (2)