Le séminaire High performance digital detectors using amorphous semiconductors est livré en anglais seulement.

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Bienvenue à tous!
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TITRE : High performance digital detectors using amorphous semiconductors

CONFÉRENCIER : Karim S. Karim, associate Director
                        Center for Bioengineering and Biotechnology
                        University of Waterloo 

Digital X-ray technology is now a reality and replacing film-screen and computed radiography technology in most medical X-ray imaging modalities. The remaining challenges for digital X-ray imagers include imaging performance for resolution sensitive and X-ray dose sensitive applications. This talk describes solutions implemented to achieve high resolution and low dose digital X-ray detectors using two detector materials: amorphous silicon and amorphous selenium.

Karim S. Karim holds a PhD from Waterloo (2002) and an MBA from Toronto (2012) and is currently a Full Professor at the University of Waterloo. He has co-authored over 170 publications in the area of large area electronics, most related to medical imaging and is a registered Professional Engineer.