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Material Surface Analysis (LASM)

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Contact Information


Research Specification

Open-access shared facility for the analysis of the surface of materials.

Research Personnel

  • Professors/Researchers: 5
  • Research Assistants and Technicians: 2

Specialized Equipments

  • XPS (VG ESCALAB 3 Mark II)
XPS, XPD, UPS, AES and LEED measurement
Preparation chamber and deposition chamber
UHV transfer modele
  • Time-of-flight SIMS (ION-TOF)
Molecular and atomic imaging capabilities
Surface penetration and lateral resolution are 1-5 nm and 100 nm respectively
Mass accuracy of 0.001 amu
  • FTIR 6000 Stingray (BioRad)
Step-scan photoacoustic and array detection capabilities for chemical mapping
  • FTIR 3000 Excalibur (BioRad)
Photoacoustic capabilities
  • Multi-mode AFM (Digital Instruments)
  • AFM/STM (Discoverer Topometrix)
  • Contact angle goniometer Ramé-Hart NRL-100
Surface thermodynamics determination

External Sources of Funding

 NSERC; FQRNT and user fees.


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