Material Surface Analysis (LASM)
Open-access shared facility for the analysis of the surface of materials.
XPS, XPD, UPS, AES and LEED measurement Preparation chamber and deposition chamber UHV transfer modele
Molecular and atomic imaging capabilities Surface penetration and lateral resolution are 1-5 nm and 100 nm respectively Mass accuracy of 0.001 amu
Step-scan photoacoustic and array detection capabilities for chemical mapping
Photoacoustic capabilities
Surface thermodynamics determination